Instruments for checking semiconductor wafers

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panasonic corporation improves quality of notebook pc with labview and pxi - national instruments toggle navigation solutions how we think about solutions we create solutions with you tailored to your industry needs. semiconductor automotive aerospace, defense, & government electronics energy academic

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offline tcm mircroscope tcm lite, tcm lab tcm microscope tcm μscope: spectrometric measurement with versatile microscope measurement head, color measurement – layer thickness measurement in many applications where spectrometric measurement is needed, the samples are microstructured in the sample plane. for

example the measurement within single pixels of flat panel displays (tft-lcd, plasma display, oled display) or the measurement on microstructured wafers in the semiconductor industry require very small spot sizes of the measurement spot. in other applications coatings on substrates have to be measured...

https://www.nxt91.com/thin-film-competencies/tcm-offline/