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epo) (class / ) atomic force microscopy [afm] or apparatus therefor, e.g., afm probes(epo) (class / ) scanning ion-conductance microscopy [sicm] or apparatus therefor, e.g., sicm probes(epo) (class / ) scanning capacitance microscopy [scm] or apparatus therefor, e.g., scm probes (epo) (class / ) magnetic
force microscopy [mfm] or apparatus therefor, e.g., mfm probes (epo) (class / ) scanning thermal microscopy [sthm] or apparatus therefor, e.g., sthm probes (epo) (class / ) scanning electro-chemical microscopy [secm] or apparatus therefor, e.g., secm probes (epo) (class / ) general aspects of spm probes...
https://patents.justia.com/patents-by-us-classification/850
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