Search Results for: Sharps derived from milling
em tic x - ion beam slope cutter, ion beam milling system leica em tic x, leica microsystems, germany em tic x - ion beam slope cutter ion beam milling system leica em tic x - leica microsystems description the triple ion beam milling system, leica em tic x allows production of cross sections and planed
scanning electron microscopy (sem), microstructure analysis (eds, wds, auger, ebsd) and, afm investigations. with the leica em tic x you achieve high quality surfaces of almost any material at room temperature or cryo, revealing the internal structures of the sample in a near native state as possible. milling...
https://m.europages.co.uk/EM-TIC-3X-Ion-beam-slope-cutter/LEICA-MICROSYSTEMS/cpid-5740131.html